Extremely low grain size, presence of few nanocrystalline and/or amorphous phases, strong texture, strong deformation of crystalline lattice, high level of internal stresses make the usage of the classical methods of material science, such as
|Hours of lecture||Hours of discussion||Hours in laboratory||Hours of independent study||Total numbers of hours|
- Demonstrate an understanding of main principles of spectroscopic methods and key process of interaction between excite beams and material surface;
- Demonstrate an understanding of constructions and principles of work of main components of spectrometers;
- To be able to suggest and explain the choice of a spectroscopic method for investigation of a concrete sample of nanomaterial;
- Demonstrate a skill to interpret the data (spectra, elemental profiles, maps of element distribution etc.) obtained by spectroscopy;
- Demonstrate knowledge of all features of the spectroscopic methods for analysis of thin films/coatings/layered structures;
- Demonstrate a skill to search required reference data (wavelength, energies etc.) for different elements/compounds using handbooks, periodical literature, and different on-line data bases;
- Demonstrate knowledge of practical applications of the spectroscopic methods for study of bulk nanomaterials and nanocomposite thin films.
Part I. Optical spectroscopy (2 hours)
- Spectroscopy methods
- Classification on radiation
- Classification of objects
- Scheme of optical spectrometer
- Typical recorded characteristics
- Color spaces
- Practical application
Part II. Optical emission spectroscopy (4 hours).
- Main types of methods
- Sources for signal creation
- Schemes of optical emission spectrometers
- The main components of spectrometers
- Features, advantages and disadvantages of glow discharge optical emission spectroscopy
- Comparison of GDOES with other methods
- Main control parameters
- Calibration and application of standard samples
- Software principles
- Practical application.
Part III. Energy-dispersive
- Interaction of electron beam with matter
- Main principles of the WDS and EDS spectroscopy
- Construction of the
- Main components of the detector
- Types of the EDS analysis
- Features of thin films investigation
Part IV. Photoelectron and Auger-electron spectroscopy (2 hours).
- Different processes after
- Main principles of the XPS and UPS spectroscopy.
- Construction of the apparatus for XPS
- Quantitative and qualitative analysis of nanomaterials including nanocomposite films
- Ways for optimization of the analysis
- Main principles and features of AES spectroscopy
Part V. Raman and Fourier-transformed infra-red spectroscopy (2 hours)
- Main vibrations of the molecules
- Types of scattering
- Main principles of Raman analysis and FTIR
- Optical schemes of the spectrometers
- Examples of practical application
- Order of phase identification using standard samples and literature data.
- A.R. West. Solid State Chemistry and Its Applications. 2nd Edition. Wiley, 2014. 584 p.
- Infrared and Raman Spectroscopy: Methods and Applications. Bernhard Schrader (Ed). VCH, Germany, Weinheim. 2008. 807 p.
- R. Kenneth Marcus, José A. C. Broekaert (Eds.) Glow Discharge Plasmas in Analytical Spectroscopy. Wiley. 2003. 498 p.
- Siegfried Hofmann, Auger- and
X-RayPhotoelectron Spectroscopy in Materials. Springer. 2013. 528 p.
- Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury. Advanced Scanning Electron Microscopy and
X-RayMicroanalysis. Springer US, 2013, 454 p.
- Horst Czichos, Tetsuya Saito, Leslie Smith. Springer Handbook of Materials Measurement Methods. Spinger. 2006. 1208 p.
- Jose Solé, Luisa Bausa, Daniel Jaque. An Introduction to the Optical Spectroscopy of Inorganic Solids. Wiley. 2005. 304 p.
- O’Connor, John, Sexton, Brett, Smart, Roger S.C. (Eds.) Surface Analysis Methods in Materials Science. Springer. 2003. 585 p.
- Spectroscopy Letters. (Taylor & Francis Group) Volumes
23-48(1990 — 2015).
- Journal of Applied Spectroscopy (Springer) Volumes
53-81(1990 — 2014).
|Class participation||20 %|
|Homework assignments||30 %|
|Final exam||50 %|